Our LM-Series laser interferometric gauging probes are
precision length measurement instruments; the first of their kind
to make contact length measurements over ranges of 0 -
20 mm to 0 - 50 mm with nanometer precision.
Compactly designed gauging heads and 8h6-mm diameter
probe shafts allow for their use with conventional length
measurement systems.
The integral miniature interferometer converts displacements of
the motor driven probe shaft into optical interference signals
that are transmitted on a fiberoptic cable to an optoelectronic
signal processing/power supply unit for processing and output
as lengths.
A frequency stabilized HeNe Laser serves as the light source
for the miniature interferometer. Compensation of
environmental influences form the basis for high metric
precisions and are achieved through the correction of laser
wavelengths.
Instrument operation and display of measurement results are controlled either through a separate keypad/display unit or a PC
running the software package supplied.
|
|
• Ultrahigh precision and accuracy achieved
through the employment of a laser
interferometric measurement technique
• Employs a frequency stabilized HeNe laser
as a length standard
• Excellent linearity in the whole measurement
coverage
• Force exerted by the gauging probe remains
constant over the full dynamic range
• Employs a fiberoptic coupled gauging probe
• Employs signal acquisition/transmission
hardware immune to electromagnetic
interference
• Causes no thermal interference with other
metrological equipment experimental setups
• Corrects for variations in laser wavelength
caused by ambient conditions
• Motor-driven probe shafts
• Usable in any orientation
|
• Precision length measurements
• Final dimensional checks
• Calibrating gauge blocks/pins/plugs, rules,
dial gauges, and other measuring devices
• Measuring thicknesses of, e.g., plastic films
• Measuring depths of indentations produced
by hardness testers
• Contact surface profiling
• Measuring deformations
• Gauging tasks in research and development
work at near-reference-standard precision
|